Jul 2018 – Jan 2019 · 6 mos · Bengaluru, Karnataka, India

Jan 2017 – Jul 2017 · 6 mos · Sendai, Miyagi, Japan

• Invented and validated a new method (hardware, acquisition protocols and algorithm) for X-ray Vector Radiography
• Single-handed project delivery (inception to results) within 6 months

Sep 2014 – Jun 2018 · 3 yrs 9 mos · Greater Munich Metropolitan Area

• Working (in a team of 5) towards the development of Anisotropic X-ray Dark-Field Tomography (AXDT), a new imaging modality for revealing sub-pixel structure orientations
• Derived the first-ever theoretical foundation of AXDT acquisition geometry and used it to optimize the setup and acquisition protocols
• Established industrial and academic collaborations for exploring the application areas of AXDT

Sep 2012 – Aug 2014 · 1 yr 11 mos

• Developed an automated method for fibre segmentation in high resolution 3D images
• Solved experimental challenges related to high resolution tomographic imaging of thin paper samples, in lab and at
• synchrotron
• Point of contact for Zeiss Versa XRM-400 microCT scanner

Jan 2012 – Jun 2012 · 5 mos · Bangalore, India

• Implemented wavelet based signal processing method for defect classification in co-axial waveguides
• Robust solution for cable fault detection wherein the cause of the defect can also be identified along with its location

May 2011 – Aug 2011 · 3 mos · Greater Vancouver Metropolitan Area

• Implemented algorithm for 3D object segmentation in realistic home scenes obtained using the Microsoft Kinect sensor.

May 2010 – Aug 2010 · 3 mos · Kalpakkam, Tamil Nadu, India

• Invented a non-contact strain measurement setup that serves as a more accurate method for strain measurement in miniature tensile specimen.

Aug 2008 – Jun 2012 · 3 yrs 10 mos