Prashanth Jadhav

Director of Engineering

Bengaluru, Karnataka, India14 yrs experience
Most Likely To SwitchHighly Stable

Key Highlights

  • Expert in VLSI and ASIC design methodologies.
  • Proven track record in silicon design engineering.
  • Strong debugging and validation skills in semiconductor projects.
Stackforce AI infers this person is a semiconductor design engineer with expertise in VLSI and ASIC technologies.

Contact

Skills

Core Skills

VlsiAsicDebuggingValidation

Other Skills

CVerilogVHDLSoCModelSimC++MatlabSystemVerilogPerlSemiconductorsEDAEmbedded SystemsICCoverage analysis

Experience

14 yrs
Total Experience
2 yrs 9 mos
Average Tenure
5 yrs
Current Experience

Amd

3 roles

Manager Silicon Design Engineering

Promoted

Jul 2023Present · 2 yrs 10 mos

VLSICVerilogASICVHDLSoC+10

Sect. Manager Silicon Design Engineering

Apr 2022Jul 2023 · 1 yr 3 mos

Member Of Technical Staff

Apr 2021Mar 2022 · 11 mos

Nxp semiconductors

Senior Lead Engineer

Jan 2019Apr 2021 · 2 yrs 3 mos

Microsemi corporation

Senior DFT Engineer

Dec 2016Jan 2019 · 2 yrs 1 mo

Qualcomm

Senior Engineer

Feb 2016Dec 2016 · 10 mos · Bangalore

Pmc-sierra

3 roles

Senior DFT Engineer

Jan 2016Feb 2016 · 1 mo · Bangalore

  • Validating the pattern generation flow which is currently implemented.
  • DCSU based AC Scan testing.
  • Broken Scan chain debug and giving feedback to implementation group.
  • Coverage analysis .
  • Validation of generated patterns for both transition and stuck-at faults (5 Mhz and at-speed frequency).
  • Mapping of all generated patterns to the TOP and validating patterns from CHIP level.
  • RAM BIST pattern generation and validation.
  • Simulation failure debug for Scan patterns and RAMBIST patterns.
  • Top Level hook-up check using Cadence Encounter Test.
  • Parallel Instance Verification of multiple instantiated blocks.

DFT Engineer

Jul 2012Dec 2015 · 3 yrs 5 mos · Bangalore

  • Validating the pattern generation flow which is currently implemented.
  • DCSU based AC Scan testing.
  • Broken Scan chain debug and giving feedback to implementation group.
  • Coverage analysis .
  • Validation of generated patterns for both transition and stuck-at faults (5 Mhz and at-speed frequency).
  • Mapping of all generated patterns to the TOP and validating patterns from CHIP level.
  • RAM BIST pattern generation and validation.
  • Simulation failure debug for Scan patterns and RAMBIST patterns.
  • Top Level hook-up check using Cadence Encounter Test.
  • Parallel Instance Verification of multiple instantiated blocks.

Intern

Jan 2012Jun 2012 · 5 mos · Bangalore

  • Test Coverage Analysis and Improvement.

Cognizant

PAT

Jan 2010Jan 2010 · 0 mo

Education

National Institute of Technology Warangal

Master's degree — VLSI

Jan 2010Jan 2012

PESIT

B.E — Electronics&Communication

Jan 2005Jan 2009

KLE

KLE

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