M

Makrani Arif

Product Engineer

Bengaluru, Karnataka, India15 yrs 7 mos experience
Most Likely To SwitchHighly Stable

Key Highlights

  • Extensive experience in DFT and ATPG methodologies.
  • Proficient in multiple programming languages including C and Perl.
  • Strong background in VLSI design and validation.
Stackforce AI infers this person is a VLSI design and testing expert with extensive DFT and validation experience.

Contact

Skills

Core Skills

DftValidationAtpgJtagMbist

Other Skills

CC++Embedded CPerlMatlabVerilogsystem verilogTetramaxSynthesisSTASynopsys DC compilerFormal VerificationSynopsys FormalitySynopsys TetramaxSynopsys VCS

Experience

15 yrs 7 mos
Total Experience
3 yrs 10 mos
Average Tenure
7 yrs 4 mos
Current Experience

Broadcom inc.

R & D Engineer IC DESIGN 4

Jan 2019Present · 7 yrs 4 mos · Bengaluru Area, India

CC++Embedded CPerlMatlabVerilog+8

Mediatek

Staff Engineer

Nov 2016Jan 2019 · 2 yrs 2 mos · Bengaluru Area, India

Mirafra technologies

Senior DFT engineer

Sep 2014Nov 2016 · 2 yrs 2 mos · Bangalore

  • Worked as a DFT consultant for Texas Instruments

Einfochips pvt ltd

DFT Engineer

Oct 2010Sep 2014 · 3 yrs 11 mos · Ahmedabad Area, India

  • 4.1 years of experience in Design for Testing (DFT) Domain in VLSI
  • Worked on scan Insertion using synopsys DC compiler tool in one project
  • Worked on formal verificatioin using synopsys formality tool in one project
  • Worked on ATPG (Legacy and Compress mode) for stuck at, transition, Iddq, Path delay and small delay defect using synopsys tetramax tool in 4 chips (28nm and multimillion gate design)
  • Worked on ATPG pattern validation ( Legacy and Compress mode) for stuck at, transition, Iddq, Path delay and small delay defect using synopsys tool VCS and Verdi in 4 chips (28nm and multimillion gate design)
  • Worked on ATPG pattern validation (Legacy and Compress mode) for stuck at and Transition using cadence ncsim and simvision in one project.
  • Worked on Tester (Agilent 93000) support and Post silicon debug for ATPG patterns in 3 chips (28nm and multimillion gate design)
  • Worked on IO testing using IEEE 1149.1 and IEEE 1149.6 JTAG standard in 4 (28nm) chips
  • Worked on MISC testing using IEEE 1687 IJTAG standard in 4 (28nm) chips
  • Worked on Hierarchical ATPG and wrapper chain verification using IEEE 1500 standards in 2 (28nm) chips
  • Worked on Power Aware ATPG in one chip
  • Worked on Hierarchical Shared Codec architecture in One chip
  • Worked on timing simulation of ATPG pattern in two chips
  • Worked on MBIST insertion and validation using client specific tool in one project
  • Worked on LBIST pattern validation using client specific tool in one project
  • Worked on Synopsys OCC controller
  • Good knowledge of synopsys compressor architecture and compress mode debug
  • Good knowledge of cadence compressor architecture and compress mode debug
  • Sound knowledge of Synthesis and STA
  • Good knowledge of scripting in perl
  • Good knowledge of C,C++, MATLAB, Verilog and System Verilog
DFTATPGJTAGMBISTValidationSynthesis+7

Education

Dharmsinh Desai University

B.E. (E.C.E.) — Electronics and Communication

Jan 2006Jan 2010

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