Mallesh Balla — CEO
DFT: * Good experience on block and SOC level test pattern generation for SAF and TDF with Bypass/Edt. * Good experience in test coverage analysis. * STA Test mode Constraints definition * Experience with IJTAG(IEEE 1149.1) programming. * Gate level simulation debug with strong understanding of DFT methodologies and tooling * Good knowledge on scan insertion, compression. .test coverage analysis. * Direct experience in silicon bring up, debug and validation DFT features on ATE-Verigy 93k * Gate Level Emulation for scan patterns using Synopsis Zebu. ATE: * Implemented the characterization program on ATE across process corners, voltage and temperature (PVT) and evaluate product margin. *Writing Test Methods on Test Cases on 93K * Develop test programs based on test plans and developed test methods. * Professional experience in test development and test program implementation and test program optimization involving yield enhancement, data collection and analysis, test time reduction and test program release. engineering and Production support for final packages and final test documentation * VTRAN experience in pattern conversation. * Hands on experience on Perl, shell, C and C++ language.
Stackforce AI infers this person is a Semiconductor Design Engineer with expertise in DFT and ATE methodologies.
Location: Bengaluru, Karnataka, India
Experience: 11 yrs 11 mos
Skills
- Atpg
- Dft
- Ate
Career Highlights
- Expert in DFT methodologies and ATPG.
- Proven track record in silicon bring up and validation.
- Strong programming skills in C, C++, and Perl.
Work Experience
AMD
Member of Technical Staff (11 mos)
Sr. Silicon Design Engineer (5 yrs 3 mos)
Tessolve
DFT Engineer (1 yr 8 mos)
ATE Engineer (4 yrs 1 mo)
Education
Bachelor of Engineering (BE) at Jawaharlal Nehru Technological University, Kakinada